{"id":3441,"date":"2022-10-09T16:42:31","date_gmt":"2022-10-09T08:42:31","guid":{"rendered":"\/\/www.fnant.com\/en\/?post_type=product&p=3441"},"modified":"2022-10-09T16:51:19","modified_gmt":"2022-10-09T08:51:19","slug":"four-point-probe-meter","status":"publish","type":"product","link":"\/\/www.fnant.com\/en\/product\/four-point-probe-meter","title":{"rendered":"Four Point Probe Meter"},"content":{"rendered":"
Four point probe meter can be selected according to different material characteristics. High wear-resistant tungsten carbide probe probe for testing the resistivity and square resistance of silicon semiconductors, graphene, heat-sensitive materials, metals, conductive plastics and other hard materials. Also have spherical gold plated copper alloy probe sensor, testable flexible material conductive film, PE film, capacitance convolution film, foil, metal coating or carbon paper, film, ceramics, glass substrate conductive film (ITO film), lithium batteries battery electrodes, hydrogen fuel cell electrode or nano coating resistivity of semiconductor materials and sheet resistance. The instrument is suitable for measuring the conductivity of conductor and semiconductor material in semiconductor material factory, universities and research institutes. The instrument adopts a high-precision constant current, flows through the DUT and the 5-terminal, measurement effectively eliminates lead error for users to make a precision measurement; at the same time instruments increased by 16 bins (1-bin over the lower limit, 14bins GD, 1-bin over upper limit) sorting function, the user can set upper and lower limits or the percentage of direct resistance error sorting, greatly improve the measurement speed of similar products. Instrument has two trigger modes: single, continuous. The continuous time without the trigger signal, and only a single measurement can be triggered by the trigger signal or trigger button on the panel, the sorting results of a single test output through a PLC interface board.<\/p>\n
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